Transmission Electron Microscopy and Diffractometry of Materials |
|
| Author:
| Fultz, Brent
Howe, James M. |
| Series title: | Advanced Texts in Physics Ser. |
| ISBN: | 978-3-540-43764-2 |
| Publication Date: | Jan 2002 |
| Publisher: | Springer
|
| Book Format: | Hardback |
| List Price: | AUD $197.95 |
Book Description:
|
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.