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Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials( )
Author: Fultz, Brent
Howe, James M.
Series title:Graduate Texts in Physics Ser.
ISBN:978-3-642-43315-3
Publication Date:Nov 2014
Publisher:Springer
Book Format:Paperback
List Price:AUD $204.00
Book Description:

This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.

Book Details
Pages:764
Detailed Subjects: Science / Physics / Optics & Light
Science / Electron Microscopes & Microscopy
Science / Microscopes & Microscopy
Physical Dimensions (W X L X H):15.5 x 23.5 cm
Book Weight:1.181 Kilograms

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