| Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III 19-20 July 1999, Denver, Colorado | | | Author:
| Fineschi, Silvano
Woodgate, Bruce
Kimble, Randy Alan | | Contribution by:
| Society of Photo-Optical Instrumentation Engineers Staff, | | ISBN: | 978-0-8194-3250-6 | | Publication Date: | Oct 1999 | | Publisher: | SPIE
| | Book Format: | Undefined | | List Price: | AUD $150.70 |
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