VLSI Test Principles and Architectures Design for Testability |
|
| Author:
| Wang, Laung-Terng
Wu, Cheng-Wen
Wen, Xiaoqing |
| Contribution by:
| Abdel-Hafez, Khader S.
Jone, Wen-Ben
Kapur, Rohit
Keller, Brion
Lee, Kuen-Jong
Li, James C. -M.
Li, Mike Peng
Li, Xiaowei
Mak, T. M.
Min, Yinghua
Nadeau-Dostie, Benoit
Bhattacharya, Soumendu
Nourani, Mehrdad
Rajski, Janusz
Stroud, Charles
Volkerink, Erik H.
Walker, Duncan M. (Hank)
Wu, Shianling
Touba, Nur A.
Chatterjee, Abhijit
Chen, Xinghao
Cheng, Kwang-Ting (Tim)
Eklow, William
Hsiao, Michael S.
Huang, Jiun-Lang
Huang, Shi-Yu |
| Series title: | Morgan Kaufmann Series in Systems on Silicon |
| ISBN: | 978-0-12-370597-6 |
| Publication Date: | Jul 2006 |
| Publisher: | Elsevier Science & Technology Books
|
| Book Format: | Hardback |
| List Price: | AUD $100.00 |
Book Description:
|
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.