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Mismatch Theory and Measurement for Semiconductors

Mismatch Theory and Measurement for Semiconductors( )
Author: Peralta, Mike
ISBN:978-1-4921-2495-5
Publication Date:Aug 2013
Publisher:CreateSpace Independent Publishing Platform
Book Format:Paperback
List Price:USD $34.95
Book Description:

THE MOST ADVANCED SEMICONDUCTOR MISMATCH TECHNIQUES

These mismatch methods are the most advanced techniques in the Semiconductor field. All the practical matters of simulation, measurement, and mismatch model parameter generation (using random field theory) including multi-device co-correlation are handled in an accurate, practical, and comprehensive manner. This represents a true advance and technical progress in the matter of semiconductor mismatch simulation and measurement. If...
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Book Details
Pages:288
Physical Dimensions (W X L X H):8.5 x 11 x 0.65 Inches
Book Weight:1.83 Pounds

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