Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance |
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| Author:
| van Schooten, Kipp |
| Series title: | Springer Theses Ser. |
| ISBN: | 978-3-319-00589-8 |
| Publication Date: | Jul 2013 |
| Publisher: | Springer International Publishing AG
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| Imprint: | Springer |
| Book Format: | Hardback |
| List Price: | USD $109.99 |
Book Description:
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This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.
This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.