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1997 IEEE International Integrated Reliability Workshop Final Report
Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
1997 IEEE International Integrated Reliability Workshop Final Report
(
)
Author:
IEEE, Electron Devices Society Staff,
IEEE, Reliability Society Staff,
International Integrated Reliability Workshop Staff,
ISBN:
978-0-7803-4206-4
Publication Date:
Jan 1997
Publisher:
IEEE
Book Format:
Paperback
List Price:
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Book Details
Pages:
161
Detailed Subjects:
Technology & Engineering / Systems Engineering
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