| A New Method for the Removal of Parasitic Capacitances from Sub-100nm Mosfets Using Low-Noise Split Capacitance-Voltage Measurements | | Author:
| Steinke, Daniel R. | ISBN: | 978-1-249-04735-3 | Publication Date: | Jul 2012 | Publisher: | Creative Media Partners, LLC
| Imprint: | Proquest, UMI Dissertation Publishing | Book Format: | Paperback | List Price: | USD $69.00 |
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