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Advances in Surface and Thin Film Diffraction

Advances in Surface and Thin Film Diffraction( )
Editor: Cohen, Philip J.
Eaglesham, David J.
Huang, Ting C.
Series title:MRS Proceedings Ser.
ISBN:978-1-55899-100-2
Publication Date:Apr 1991
Publisher:Cambridge University Press
Book Format:Hardback
List Price:Contact Supplier contact USD $40.99
Book Description:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Book Details
Pages:398
Detailed Subjects: Technology & Engineering / Materials Science / Thin Films, Surfaces & Interfaces
Science / Physics / Optics & Light
Physical Dimensions (W X L X H):0.858 x 8.931 x 5.928 Inches
Book Weight:1.54 Pounds



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