Analog IC Reliability in Nanometer CMOS |
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| Author:
| Maricau, Elie
Gielen, Georges |
| Series title: | Analog Circuits and Signal Processing Ser. |
| ISBN: | 978-1-4899-8630-6 |
| Publication Date: | Jun 2015 |
| Publisher: | Springer New York
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $139.99USD $109.99 |
Book Description:
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This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.