Beam Diagnostics in Superconducting Accelerating Cavities The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes |
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| Author:
| Zhang, Pei |
| Series title: | Springer Theses Ser. |
| ISBN: | 978-3-319-34616-8 |
| Publication Date: | Aug 2016 |
| Publisher: | Springer International Publishing AG
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $109.99USD $109.99 |
Book Description:
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This book provides a detailed survey of various dimension reduction methods applicable for rf diagnostics. It is an ideal resource for students new to the field as well as for scientists well-versed in rf diagnostics.
This book provides a detailed survey of various dimension reduction methods applicable for rf diagnostics. It is an ideal resource for students new to the field as well as for scientists well-versed in rf diagnostics.