CMOS Gate-Stack Scaling Vol. 1155Materials, Interfaces and Reliability Implications |
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| Editor:
| Butterbaugh, J.
Demkov, A.
Harris, R.
Rachmady, W.
Taylor, B. |
| Series title: | MRS Proceedings Ser. |
| ISBN: | 978-1-60511-128-5 |
| Publication Date: | Nov 2009 |
| Publisher: | Cambridge University Press
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| Book Format: | Hardback |
| List Price: | USD $119.00 |
Book Description:
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.