CTL for Test Information of Digital ICS |
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| Author:
| Kapur, Rohit |
| ISBN: | 978-1-4020-7293-2 |
| Publication Date: | Oct 2002 |
| Publisher: | Springer
|
| Book Format: | Hardback |
| List Price: | USD $109.99 |
Book Description:
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From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability
From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability