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Series Title

Characterization of Crystal Growth Defects by X-Ray Methods

(

)

Editor:

Tanner, Brian K.
Bowen, D. Keith

Series title:

NATO ASI B Ser.

ISBN:

978-0-306-40628-7

Publication Date:

Jan 1981

Publisher:

Basic Books

Book Format:

Hardback

List Price:

USD $110.00

Book Details

Pages:	616
Detailed Subjects:	Science / Physics / Crystallography

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