Characterization of High Tc Materials and Devices by Electron Microscopy |
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| Editor:
| Browning, Nigel D.
Pennycook, Stephen J. |
| ISBN: | 978-0-521-55490-9 |
| Publication Date: | Jul 2000 |
| Publisher: | Cambridge University Press
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| Book Format: | Hardback |
| List Price: | USD $140.00 |
Book Description:
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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.