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Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics

Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics( )
Author: Khatri, Sunil P.
Brayton, Robert K.
Sangiovanni-Vincentelli, Alberto L.
ISBN:978-0-7923-7407-7
Publication Date:Jun 2001
Publisher:Springer
Book Format:Hardback
List Price:USD $109.99
Book Description:

This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring...
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Book Details
Pages:112
Detailed Subjects: Technology & Engineering / Electronics / Circuits / Vlsi & Ulsi
Physical Dimensions (W X L X H):6.045 x 9.165 Inches
Book Weight:1.826 Pounds



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