Development of Ellipsometric Microscopy as a Quantitative High-Resolution Technique for the Investigation of Thin Films at Glass-Water and Silicon-Air Interfaces

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Author:

Series title:

Schriften des Forschungszentrums Jülich

ISBN:

978-3-89336-373-5

Publication Date:

Jan 2004

Publisher:

Forschungszentrum Julich GmbH - Zentralbibliothek, Verlag

Book Format:

Paperback

List Price:

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Book Details

Pages:	135
Detailed Subjects:	Technology & Engineering / Materials Science / Thin Films, Surfaces & Interfaces
Physical Dimensions (W X L X H):	6.63 x 9.36 Inches

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