Electron Beam-Specimen Interactions and Simulation Methods in Microscopy |
|
| Author:
| Mendis, Budhika G. |
| Series title: | RMS - Royal Microscopical Society Ser. |
| ISBN: | 978-1-118-69654-5 |
| Publication Date: | Apr 2018 |
| Publisher: | John Wiley & Sons, Incorporated
|
| Book Format: | Digital online |
| List Price: | USD $129.95 |
Book Description:
|
A detailed presentation of the physics of electron beam-specimen interactions
Electron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences.
A detailed presentation of the physics of electron beam-specimen interactions
Electron microscopy is one of the most widely used characterisation techniques in materials science, physics, chemistry, and the life sciences.