High-Resolution Electron Microscopy of Defects in Materials |
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| Editor:
| Dahmen, Ulrich
Sinclair, R.
Smith, David J. |
| Series title: | MRS Proceedings Ser. |
| ISBN: | 978-1-55899-072-2 |
| Publication Date: | Aug 1990 |
| Publisher: | Cambridge University Press
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| Book Format: | Hardback |
| List Price: | USD $40.99 |
Book Description:
|
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.