Introduction to Optical Metrology |
|
| Author:
| Sirohi, Rajpal S. |
| Series title: | Optical Sciences and Applications of Light Ser. |
| ISBN: | 978-1-351-83111-6 |
| Publication Date: | Jul 2017 |
| Publisher: | Taylor & Francis Group
|
| Imprint: | CRC Press |
| Book Format: | Digital (delivered electronically) |
| List Price: | USD $140.00 |
Book Description:
|
This book examines the theory and practice of various measurement methodologies utilizing the wave nature of light. It discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy. It describes the principles used to measure refractive indices of solids, liquids, and gases. It presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length. It details techniques for optical testing as well as for making fiber...
More Description
This book examines the theory and practice of various measurement methodologies utilizing the wave nature of light. It discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy. It describes the principles used to measure refractive indices of solids, liquids, and gases. It presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length. It details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements. It also features exercise problems at the end of each chapter for applied learning.