Materials Characterization Introduction to Microscopic and Spectroscopic Methods |
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| Author:
| Leng, Yang |
| ISBN: | 978-0-470-82298-2 |
| Publication Date: | Jun 2008 |
| Publisher: | John Wiley & Sons, Incorporated
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| Imprint: | Wiley |
| Book Format: | Hardback |
| List Price: | USD $136.00 |
Book Description:
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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described.
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described.