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Materials Reliability in Microelectronics V

Materials Reliability in Microelectronics V( )
Editor: Oates, Anthony S.
Gadepally, Kamesh
Rosenberg, Robert
Filter, William F.
Greer, A. Lindsay
Series title:MRS Proceedings Ser.
ISBN:978-1-55899-294-8
Publication Date:Oct 1995
Publisher:Materials Research Society
Book Format:Hardback
List Price:USD $29.99
Book Description:

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Book Details
Pages:523
Detailed Subjects: Technology & Engineering / Electronics / Microelectronics
Book Weight:1.95 Pounds



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