Materials and Reliability Handbook for Semiconductor Optical and Electron Devices |
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| Editor:
| Ueda, Osamu
Pearton, Stephen J. |
| ISBN: | 978-1-4614-4336-0 |
| Publication Date: | Sep 2012 |
| Publisher: | Springer New York
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| Imprint: | Springer |
| Book Format: | Hardback |
| List Price: | USD $329.99 |
Book Description:
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This book covers reliability procedures for lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Addresses reliability engineering, materials, reliability testing and electronic characterization.
This book covers reliability procedures for lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Addresses reliability engineering, materials, reliability testing and electronic characterization.