Measurement Techniques for Radio Frequency Nanoelectronics |
|
| Author:
| Wallis, T. Mitch
Kabos, Pavel |
| Series title: | The Cambridge RF and Microwave Engineering Ser. |
| ISBN: | 978-1-107-12068-6 |
| Publication Date: | Sep 2017 |
| Publisher: | Cambridge University Press
|
| Book Format: | Hardback |
| List Price: | USD $154.00 |
Book Description:
|
Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.
Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.