Mechanical Stress on the Nanoscale Simulation, Material Systems and Characterization Techniques |
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| Editor:
| Hanbücken, Margrit
Müller, Pierre
Wehrspohn, Ralf B. |
| ISBN: | 978-3-527-63955-7 |
| Publication Date: | Dec 2011 |
| Publisher: | John Wiley & Sons, Incorporated
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| Imprint: | Wiley-VCH |
| Book Format: | Digital download |
| List Price: | Contact Supplier contact
Contact Supplier contact
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Book Description:
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Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.