Modeling Nanoscale Imaging in Electron Microscopy |
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| Editor:
| Vogt, Thomas
Dahmen, Wolfgang
Binev, Peter |
| Series title: | Nanostructure Science and Technology Ser. |
| ISBN: | 978-1-4899-9728-9 |
| Publication Date: | Apr 2014 |
| Publisher: | Springer New York
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $139.99USD $109.99 |
Book Description:
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This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.