Nanoscale Memory Repair |
|
| Author:
| Horiguchi, Masashi
Itoh, Kiyoo |
| Series title: | Integrated Circuits and Systems Ser. |
| ISBN: | 978-1-4419-7957-5 |
| Publication Date: | Jan 2011 |
| Publisher: | Springer New York
|
| Imprint: | Springer |
| Book Format: | Hardback |
| List Price: | USD $169.99USD $169.99 |
Book Description:
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Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations.
Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations.