Next Generation HALT and HASS Robust Design of Electronics and Systems |
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| Author:
| Gray, Kirk A.
Paschkewitz, John J. |
| Series title: | Quality and Reliability Engineering Ser. |
| ISBN: | 978-1-118-70023-5 |
| Publication Date: | May 2016 |
| Publisher: | John Wiley & Sons, Incorporated
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| Book Format: | Hardback |
| List Price: | USD $125.95 |
Book Description:
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Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.