Optical Methods of Measurement Wholefield Techniques, Second Edition |
|
| Author:
| Sirohi, Rajpal |
| Series title: | Optical Science and Engineering Ser. |
| ISBN: | 978-1-351-82855-0 |
| Publication Date: | Sep 2018 |
| Publisher: | Taylor & Francis Group
|
| Imprint: | CRC Press |
| Book Format: | Digital (delivered electronically) |
| List Price: | USD $89.95 |
Book Description:
|
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.
The book explores the propagation of laser beams, metrological...
More Description
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.
The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity.
This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.