Quantum Metrology, Imaging, and Communication |
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| Author:
| Simon, David S.
Jaeger, Gregg
Sergienko, Alexander V. |
| Series title: | Quantum Science and Technology Ser. |
| ISBN: | 978-3-319-46549-4 |
| Publication Date: | Dec 2016 |
| Publisher: | Springer International Publishing AG
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| Imprint: | Springer |
| Book Format: | Hardback |
| List Price: | USD $149.99USD $169.99 |
Book Description:
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This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion...
More DescriptionThis book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.