Recent Advances in Life-Testing and Reliability |
|
| Author:
| Balakrishnan, N. |
| Contribution by:
| Harter, H. Leon
Anderson, Jon E.
Sen, Ananda
Benski, Claudio
Meeker, William Q.
Prescott, Philip
Smith, Richard L.
Hosking, J. R. M.
McDonald, Gary C.
Gibbons, Diane I.
Vance, Lonnie C.
Pena, Edsel A.
Hamada, Michael
Wood, Nelson O.
Nelson, Peter R.
Engelhardt, Max
Doganaksoy, Necip
Robinson, Jeffrey A.
Martz, Harry F.
Bhattacharyya, Gouri K.
Nelson, Wayne
Ebrahimi, Nader
Basu, Asit P.
Chen, Gemai
Zacks, Shelemyahu
Feinberg, Alec
Cabau, Emmanuel
Prairie, Richard R.
Garrigoux, Christian G.
Green, David
Evans, James W.
Bedford, T. J.
Arnold, Barry C.
Koutras, M. V.
Papastavridis, S. G.
Petakos, Kyriakos I.
Gibson, Greg
Bandyopadhyay, D.
Cooke, Roger
Kulasekera, K. B.
Parker, Robert L.
Tsokos, Chris P.
Widom, Alan
Zimmer, William J.
Suzuki, Kazuyuki
Barlow, Richard E.
Johnson, Richard A.
Chen, Piug-Shing |
| ISBN: | 978-0-8493-8972-6 |
| Publication Date: | Apr 1995 |
| Publisher: | CRC Press LLC
|
| Book Format: | Hardback |
| List Price: | USD $170.00USD $297.00USD $446.00 |
Book Description:
|
This book presents chapters written on the areas of life-testing and reliability, including inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, and accelerated testing.
This book presents chapters written on the areas of life-testing and reliability, including inference under censoring and truncation, reliability growth models, designs to improve quality, prediction techniques, Bayesian analysis of reliability, multivariate methods, and accelerated testing.