Reliability and Degradation of III-V Optical Devices

(

)

Author:

Ueda, Osamu

Series title:

Optoelectronics Library

ISBN:

978-0-89006-652-2

Publication Date:

Sep 1996

Publisher:

Artech House

Book Format:

Hardback

List Price:

USD $149.00

Book Description:

Book Details

Pages:	353
Detailed Subjects:	Technology & Engineering / Electronics / Semiconductors Science / Physics / Crystallography
Physical Dimensions (W X L X H):	6 x 9 x 6 Inches
Book Weight:	1.43 Pounds

Author Biography

Ueda, Osamu (Author)

Osamu Ueda earned his Ph.D. in physical engineering from the University of Tokyo.

Ueda is a senior researcher at Fujitsu Laboratories Ltd., Japan. Dr. Ueda has written more than 100 professional papers and is a member of the Society of Applied Physics, the Society of Electron Microscopy, the Electrochemical Society, and the Materials Research Society.

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