Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures |
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| Author:
| Stanisavljevi, Milos
Schmid, Alexandre
Leblebici, Yusuf |
| ISBN: | 978-1-4899-8254-4 |
| Publication Date: | Oct 2014 |
| Publisher: | Springer New York
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $109.99 |
Book Description:
|
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.