Scan Statistics |
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| Author:
| Glaz, Joseph
Naus, Joseph
Wallenstein, Sylvan |
| Series title: | Springer Series in Statistics Ser. |
| ISBN: | 978-1-4419-3167-2 |
| Publication Date: | Dec 2010 |
| Publisher: | Springer New York
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| Imprint: | Springer |
| Book Format: | Paperback |
| List Price: | USD $109.99 |
Book Description:
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In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield...
More DescriptionIn many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.