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Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis( 1 customer ratings | )
Author: Goldstein, Joseph
Echlin, Patrick
Joy, David C.
Lifshin, Eric
Lyman, Charles E.
Michael, J. R.
Newbury, Dale E.
Sawyer, Linda
ISBN:978-0-306-47292-3
Publication Date:Apr 2007
Publisher:Springer
Book Format:Hardback
List Price:USD $119.99
Book Description:

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.

Book Details
Pages:689
Detailed Subjects: Science / Electron Microscopes & Microscopy
Science / Microscopes & Microscopy
Physical Dimensions (W X L X H):6.942 x 9.906 Inches
Book Weight:4.506 Pounds



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