Scanning Microscopies 2013 Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences |
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Author:
| Postek, Michael Newbury, Dale Platek, S. Frank Maugel, Tim |
Series title: | Proceedings of SPIE Ser. |
ISBN: | 978-0-8194-9520-4 |
Publication Date: | Jun 2013 |
Publisher: | SPIE
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Book Format: | Undefined |
List Price: | Contact Supplier contact
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Book Description:
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Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.