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Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

Scanning Probe Microscopy( )
Author: Foster, Adam
Hofer, Werner A.
Series title:NanoScience and Technology Ser.
ISBN:978-1-4419-2306-6
Publication Date:Nov 2010
Publisher:Springer New York
Imprint:Springer
Book Format:Paperback
List Price:USD $169.99
Book Description:

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework...
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Book Details
Pages:282
Detailed Subjects: Science / Electron Microscopes & Microscopy
Physical Dimensions (W X L X H):6.045 x 9.165 Inches
Book Weight:1.003 Pounds



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