Semiconductor Material and Device Characterization |
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| Author:
| Schroder, Dieter K. |
| Series title: | IEEE Press Ser. |
| ISBN: | 978-0-471-73906-7 |
| Publication Date: | Jun 2015 |
| Publisher: | John Wiley & Sons, Incorporated
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| Imprint: | Wiley-IEEE Press |
| Book Format: | Hardback |
| List Price: | USD $223.95USD $174.00 |
Book Description:
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This Third Edition updates a landmark text with the latest findings
The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.