Semiconductor Material and Device Characterization |
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| Author:
| Schroder, Dieter K. |
| Series title: | IEEE Press Ser. |
| ISBN: | 978-0-471-74909-7 |
| Publication Date: | Apr 2005 |
| Publisher: | John Wiley & Sons, Incorporated
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| Imprint: | Wiley-IEEE Press |
| Book Format: | Digital online |
| List Price: | USD $209.95 |
Book Description:
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Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.
Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.