Silver Metallization Stability and Reliability |
|
Author:
| Adams, Daniel Alford, Terry L. Mayer, James W. |
Series title: | Engineering Materials and Processes Ser. |
ISBN: | 978-1-84800-026-1 |
Publication Date: | Oct 2007 |
Publisher: | Springer London, Limited
|
Imprint: | Springer |
Book Format: | Hardback |
List Price: | USD $109.99 |
Book Description:
|
Anyone involved in circuit technology will find this an absolute must-read. It's the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology.
Anyone involved in circuit technology will find this an absolute must-read. It's the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology.