Thermal-Aware Testing of Digital VLSI Circuits and Systems |
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Author:
| Chattopadhyay, Santanu |
ISBN: | 978-0-8153-7882-2 |
Publication Date: | Apr 2018 |
Publisher: | CRC Press LLC
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Book Format: | Hardback |
List Price: | USD $70.00 |
Book Description:
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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware...
More Description
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips