Thermal-Aware Testing of Digital VLSI Circuits and Systems |
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| Author:
| Chattopadhyay, Santanu |
| ISBN: | 978-1-351-22776-6 |
| Publication Date: | Apr 2018 |
| Publisher: | Taylor & Francis Group
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| Imprint: | CRC Press |
| Book Format: | Digital (delivered electronically) |
| List Price: | USD $22.95 |
Book Description:
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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.