Search Type
  • All
  • Subject
  • Title
  • Author
  • Publisher
  • Series Title
Search Title

Download

Transient-Induced Latchup in CMOS Integrated Circuits

Transient-Induced Latchup in CMOS Integrated Circuits( )
Author: Ker, Ming-Dou
Hsu, Sheng-Fu
Ker, Ming-Dou
Hsu, Sheng-Fu
Series title:IEEE Press Ser.
ISBN:978-0-470-82408-5
Publication Date:Jul 2009
Publisher:John Wiley & Sons, Incorporated
Imprint:Wiley-IEEE Press
Book Format:Digital download
List Price:Contact Supplier contact Contact Supplier contact
Book Description:

The book all semiconductor device engineers must read to gain a practical feel for latchup-induced failure to produce lower-cost and higher-density chips.

Transient-Induced Latchup in CMOS Integrated Circuits  equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout. Ker and Hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the critical issues...
More Description

Book Details
Pages:320
Detailed Subjects: Technology & Engineering / Electronics / General
Technology & Engineering / Electronics / Semiconductors
Physical Dimensions (W X L X H):6.845 x 9.848 x 0.702 Inches



Featured Books

What Have We Here?
Williams, Billy Dee
Hardback: $32.00
Grief Is for People
Crosley, Sloane
Hardback: $27.00
Sense and Sensibility
Austen, Jane
Hardback: $17.00

Rate this title:

Select your rating below then click 'submit'.






I do not wish to rate this title.