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Transient-Induced Latchup in CMOS Integrated Circuits

Transient-Induced Latchup in CMOS Integrated Circuits( )
Author: Ker, Ming-Dou
Hsu, Sheng-Fu
Ker, Ming-Dou
Hsu, Sheng-Fu
Series title:IEEE Press Ser.
ISBN:978-0-470-82408-5
Publication Date:Jul 2009
Publisher:John Wiley & Sons, Incorporated
Imprint:Wiley-IEEE Press
Book Format:Digital download
List Price:Contact Supplier contact Contact Supplier contact
Book Description:

The book all semiconductor device engineers must read to gain a practical feel for latchup-induced failure to produce lower-cost and higher-density chips.

Transient-Induced Latchup in CMOS Integrated Circuits  equips the practicing engineer with all the tools needed to address this regularly occurring problem while becoming more proficient at IC layout. Ker and Hsu introduce the phenomenon and basic physical mechanism of latchup, explaining the critical issues...
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Book Details
Pages:320
Detailed Subjects: Technology & Engineering / Electronics / General
Technology & Engineering / Electronics / Semiconductors
Physical Dimensions (W X L X H):6.845 x 9.848 x 0.702 Inches



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