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Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials( )
Author: Fultz, Brent
Howe, James M.
ISBN:978-3-662-04516-9
Publication Date:Nov 2013
Publisher:Springer Berlin / Heidelberg
Imprint:Springer
Book Format:Ebook
List Price:USD $99.00
Book Description:

Aims and Scope of the Book This textbook was written for advanced un­ dergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials...
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Book Details
Pages:748



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