Ultrathin Polymer Films Confinement Effects and Structural Properties |
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| Author:
| Thomas, Sabu
Bal, Jayanta Kumar |
| ISBN: | 978-0-323-91418-5 |
| Publication Date: | Mar 2025 |
| Publisher: | Elsevier
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| Book Format: | Ebook |
| List Price: | USD $240.00USD $288.00 |
Book Description:
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Ultrathin Polymer Films: Confinement Effects and Structural Properties brings together cutting-edge research into polymeric ultrathin films below 100nm, covering preparation, characterization, measurement of structural properties, and applications.
The book begins by introducing polymer confinement and anomalous behavior, and then describes the latest techniques for the preparation and characterization of ultrathin film. Subsequent chapters provide detailed, methodical...
More Description
Ultrathin Polymer Films: Confinement Effects and Structural Properties brings together cutting-edge research into polymeric ultrathin films below 100nm, covering preparation, characterization, measurement of structural properties, and applications.
The book begins by introducing polymer confinement and anomalous behavior, and then describes the latest techniques for the preparation and characterization of ultrathin film. Subsequent chapters provide detailed, methodical coverage of the various steps and key factors in the process, especially relating to properties, including glass transition behavior, density variation, dewetting and stability, effect of supercritical carbon dioxide, relaxation of the swollen polymer, and the structure and swelling of block copolymer thin films. Throughout the book, the authors address the existing discrepancies and challenges relating to the effect of confinement on structural properties and their measurement, and aim to guide the reader towards novel applications.
This is a valuable resource for researchers and advanced students in polymer science, polymer chemistry, nanotechnology, materials science, and chemical engineering, as well as for engineers, scientists, and R&D professionals with an interest polymer-based ultrathin films for industrial applications.
- Focuses on ultrathin films with a thickness below 100nm, down to the highest confinement of 1.5 nm.
- Explains state-of-the-art probing techniques, such as X-ray reflectivity (XRR) and atomic force microscopy (AFM).
- Aims to demystify the challenges relating to the effect of confinement on properties, and their measurement.