VLSI Test Principles and Architectures Design for Testability |
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| Author:
| Wang, Laung-Terng
Wu, Cheng-Wen
Wen, Xiaoqing |
| Contribution by:
| Abdel-Hafez, Khader S.
Jone, Wen-Ben
Kapur, Rohit
Keller, Brion
Lee, Kuen-Jong
Li, James C. -M.
Li, Mike Peng
Li, Xiaowei
Mak, T. M.
Min, Yinghua
Nadeau-Dostie, Benoit
Bhattacharya, Soumendu
Nourani, Mehrdad
Rajski, Janusz
Stroud, Charles
Volkerink, Erik H.
Walker, Duncan M. (Hank)
Wu, Shianling
Touba, Nur A.
Chatterjee, Abhijit
Chen, Xinghao
Cheng, Kwang-Ting (Tim)
Eklow, William
Hsiao, Michael S.
Huang, Jiun-Lang
Huang, Shi-Yu |
| ISBN: | 978-0-08-047479-3 |
| Publication Date: | Aug 2006 |
| Publisher: | Elsevier
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| Book Format: | Ebook |
| List Price: | USD $86.95USD $104.34 |
Book Description:
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The most up-to-date coverage available of VLSI Testing and Design-for-Testability!
The most up-to-date coverage available of VLSI Testing and Design-for-Testability!