VLSI Test Principles and Architectures Design for Testability |
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Author:
| Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing |
Contribution by:
| Abdel-Hafez, Khader S. Jone, Wen-Ben Kapur, Rohit Keller, Brion Lee, Kuen-Jong Li, James C. -M. Li, Mike Peng Li, Xiaowei Mak, T. M. Min, Yinghua Nadeau-Dostie, Benoit Bhattacharya, Soumendu Nourani, Mehrdad Rajski, Janusz Stroud, Charles Volkerink, Erik H. Walker, Duncan M. (Hank) Wu, Shianling Touba, Nur A. Chatterjee, Abhijit Chen, Xinghao Cheng, Kwang-Ting (Tim) Eklow, William Hsiao, Michael S. Huang, Jiun-Lang Huang, Shi-Yu |
ISBN: | 978-0-12-370597-6 |
Publication Date: | Aug 2006 |
Publisher: | Elsevier Science & Technology
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Imprint: | Morgan Kaufmann |
Book Format: | Hardback |
List Price: | USD $89.95 |
Book Description:
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.