Related Books | Bookwire

1.

Encyclopedia of Materials Characterization

Surfaces, Interfaces, Thin Films

Author:: Brundle, Richard
Evans, Charles
Wilson, Shaun

ISBN:: 978-0-7506-9168-0

Book Format:: Hardback

List Price:: USD $235.00

Publisher:: Elsevier Science & Technology Books

Publication Date:: Aug 1992

2.

Characterization of Optical Materials

Author:: Exarhos, Gregory J.

ISBN:: 978-0-7506-9298-4

Book Format:: Hardback

List Price:: USD $84.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Mar 1993

3.

Characterization in Semiconductor Compound Process... - a book by Strausser, Yale

Characterization in Semiconductor Compound Processing

Author:: Strausser, Yale

ISBN:: 978-0-7506-9266-3

Book Format:: Hardback

List Price:: USD $84.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Oct 1994

4.

Characterization in Silicon Processing

Author:: Strausser, Yale

ISBN:: 978-0-7506-9172-7

Book Format:: Hardback

List Price:: USD $84.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Sep 1993

5.

Characterization of Tribological Materials

ISBN:: 978-0-7506-9297-7

Book Format:: Hardback

List Price:: USD $84.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Oct 1993

6.

Encyclopedia of Materials Characterization

Surfaces, Interfaces, Thin Films

Author:: Brundle, Richard
Evans, Charles
Wilson, Shaun

ISBN:: 978-0-7506-9168-0

Book Format:: Hardback

List Price:: AUD $345.00

Publisher:: Elsevier Science & Technology Books

Publication Date:: Aug 1992

7.

Characterization of Ceramics

Author:: Loehman, Ronald E.

ISBN:: 978-0-7506-9253-3

Book Format:: Hardback

List Price:: USD $84.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Jan 1993

8.

Characterization of Catalytic Materials

Author:: Wachs, Israel E.

ISBN:: 978-0-7506-9241-0

Book Format:: Hardback

List Price:: USD $84.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Sep 1992

9.

Characterization of Organic Thin Films

Author:: Ulman, Abraham

ISBN:: 978-0-7506-9467-4

Book Format:: Hardback

List Price:: USD $84.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Oct 1994

10.

Characterization of Integrated Circuit Packaging Materials

ISBN:: 978-0-7506-9267-0

Book Format:: Hardback

List Price:: USD $94.95

Publisher:: Elsevier Science & Technology Books

Publication Date:: Aug 1993

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1.		Encyclopedia of Materials Characterization Surfaces, Interfaces, Thin Films Author: Brundle, Richard Evans, Charles Wilson, Shaun ISBN: 978-0-7506-9168-0 Book Format: Hardback List Price: USD $235.00 Publisher: Elsevier Science & Technology Books Publication Date: Aug 1992 Quantity Note

2.		Characterization of Optical Materials Author: Exarhos, Gregory J. ISBN: 978-0-7506-9298-4 Book Format: Hardback List Price: USD $84.95 Publisher: Elsevier Science & Technology Books Publication Date: Mar 1993 Quantity Note

3.		Characterization in Semiconductor Compound Processing Author: Strausser, Yale ISBN: 978-0-7506-9266-3 Book Format: Hardback List Price: USD $84.95 Publisher: Elsevier Science & Technology Books Publication Date: Oct 1994 Quantity Note

4.		Characterization in Silicon Processing Author: Strausser, Yale ISBN: 978-0-7506-9172-7 Book Format: Hardback List Price: USD $84.95 Publisher: Elsevier Science & Technology Books Publication Date: Sep 1993 Quantity Note

5.		Characterization of Tribological Materials ISBN: 978-0-7506-9297-7 Book Format: Hardback List Price: USD $84.95 Publisher: Elsevier Science & Technology Books Publication Date: Oct 1993 Quantity Note

6.		Encyclopedia of Materials Characterization Surfaces, Interfaces, Thin Films Author: Brundle, Richard Evans, Charles Wilson, Shaun ISBN: 978-0-7506-9168-0 Book Format: Hardback List Price: AUD $345.00 Publisher: Elsevier Science & Technology Books Publication Date: Aug 1992 Quantity Note

7.		Characterization of Ceramics Author: Loehman, Ronald E. ISBN: 978-0-7506-9253-3 Book Format: Hardback List Price: USD $84.95 Publisher: Elsevier Science & Technology Books Publication Date: Jan 1993 Quantity Note

8.		Characterization of Catalytic Materials Author: Wachs, Israel E. ISBN: 978-0-7506-9241-0 Book Format: Hardback List Price: USD $84.95 Publisher: Elsevier Science & Technology Books Publication Date: Sep 1992 Quantity Note

9.		Characterization of Organic Thin Films Author: Ulman, Abraham ISBN: 978-0-7506-9467-4 Book Format: Hardback List Price: USD $84.95 Publisher: Elsevier Science & Technology Books Publication Date: Oct 1994 Quantity Note

10.		Characterization of Integrated Circuit Packaging Materials ISBN: 978-0-7506-9267-0 Book Format: Hardback List Price: USD $94.95 Publisher: Elsevier Science & Technology Books Publication Date: Aug 1993 Quantity Note