Books By Echlin, Patrick

Displaying 1- 11 of 11 results for keyword "Charles-E-Lyman" books

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1.		Scanning Electron Microscopy and X-Ray Microanalysis Author: Goldstein, Joseph Echlin, Patrick Joy, David C. Lifshin, Eric Lyman, Charles E. Michael, J. R. Newbury, Dale E. Sawyer, Linda ISBN: 978-0-306-47292-3 Book Format: Hardback List Price: AUD $207.95 Publisher: Springer Netherlands Publication Date: Jan 2003 Quantity Note

2.		Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy Author: Lyman, Charles E. Armstrong, John Echlin, Patrick Fiori, Charles Goldstein, Joseph Joy, David C. Lifshin, Eric Romig, Alton D. Williams, David B. Peters, Klaus-Rüdiger ISBN: 978-0-306-43591-1 Book Format: Paperback List Price: AUD $269.95 Publisher: Springer Netherlands Publication Date: Jan 1990 Quantity Note

3.		Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy Author: Lyman, Charles E. Armstrong, John Echlin, Patrick Fiori, Charles Goldstein, Joseph Joy, David C. Lifshin, Eric Romig, Alton D. Williams, David B. Peters, Klaus-Rüdiger ISBN: 978-0-306-43591-1 Book Format: Paperback List Price: USD $109.99 Publisher: Springer Publication Date: Aug 1990 Quantity Note

4.		Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists,... Author: Goldstein, Joseph Newbury, Dale E. Echlin, Patrick Joy, David C. Romig Jr., Alton D. Lyman, Charles E. Fiori, Charles Lifshin, Eric ISBN: 978-1-4613-0491-3 Book Format: Ebook List Price: USD $99.00 Publisher: Springer Publication Date: Dec 2012 Quantity Note

5.		Scanning Electron Microscopy and X-Ray Microanalysis Third Edition Author: Goldstein, Joseph Newbury, Dale E. Joy, David C. Lyman, Charles E. Echlin, Patrick Lifshin, Eric Sawyer, Linda Michael, J. R. ISBN: 978-1-4615-0215-9 Book Format: Ebook List Price: USD $99.00 Publisher: Springer Publication Date: Dec 2012 Quantity Note

6.		Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists,... Author: Goldstein, Joseph Newbury, Dale E. Echlin, Patrick Joy, David C. Romig Jr., Alton D. Lyman, Charles E. Fiori, Charles Lifshin, Eric ISBN: 978-1-4612-7653-1 Book Format: Paperback List Price: USD $109.99 Publisher: Springer Publication Date: Sep 2011 Quantity Note

7.		Scanning Electron Microscopy and X-Ray Microanalysis Third Edition Author: Goldstein, Joseph Newbury, Dale E. Joy, David C. Lyman, Charles E. Echlin, Patrick Lifshin, Eric Sawyer, Linda Michael, J. R. ISBN: 978-1-4613-4969-3 Book Format: Paperback List Price: USD $119.99 Publisher: Springer Publication Date: May 2013 Quantity Note

8.		Scanning Electron Microscopy and X-Ray Microanalysis Author: Goldstein, Joseph Echlin, Patrick Joy, David C. Lifshin, Eric Lyman, Charles E. Michael, J. R. Newbury, Dale E. Sawyer, Linda ISBN: 978-0-306-47292-3 Book Format: Hardback List Price: USD $119.99 Publisher: Springer Publication Date: Jan 2003 Quantity Note

9.		Scanning Electron Microscopy and X-Ray Microanalysis A Text for Biologists, Materials Scientists,... Author: Goldstein, Joseph Newbury, Dale E. Echlin, Patrick Joy, David C. Romig Jr., Alton D. Lyman, Charles E. Fiori, Charles Lifshin, Eric ISBN: 978-1-4612-7653-1 Book Format: Paperback List Price: AUD $269.95 Publisher: Springer Publication Date: Sep 2011 Quantity Note

10.		Scanning Electron Microscopy and X-Ray Microanalysis Third Edition Author: Goldstein, Joseph Newbury, Dale E. Joy, David C. Lyman, Charles E. Echlin, Patrick Lifshin, Eric Sawyer, Linda Michael, J. R. ISBN: 978-1-4613-4969-3 Book Format: Paperback List Price: AUD $166.95 Publisher: Springer Publication Date: Oct 2013 Quantity Note

11.		Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy A Laboratory Workbook Author: Lyman, Charles E. Newbury, Dale E. Goldstein, Joseph Williams, David B. Romig Jr., Alton D. Armstrong, John Echlin, Patrick Fiori, Charles Joy, David C. Lifshin, Eric Peters, Klaus-Rüdiger Peters, Klaus-Rüdiger ISBN: 978-1-4613-0635-1 Book Format: Ebook List Price: USD $99.00 Publisher: Springer Publication Date: Dec 2012 Quantity Note