Books By Kapur, Rohit

1.

CTL for Test Information of Digital ICS

Author:: Kapur, Rohit

ISBN:: 978-1-4020-7293-2

Book Format:: Hardback

List Price:: USD $109.99

Publisher:: Springer

Publication Date:: Oct 2002

2.

CTL for Test Information of Digital ICs

Author:: Kapur, Rohit

ISBN:: 978-0-306-47826-0

Book Format:: Ebook

List Price:: USD $179.00

Publisher:: Springer London, Limited

Publication Date:: May 2007

3.

CTL for Test Information of Digital ICs

Author:: Kapur, Rohit

ISBN:: 978-1-4757-7800-7

Book Format:: Paperback

List Price:: USD $109.99

Publisher:: Springer

Publication Date:: Apr 2013

4.

CTL for Test Information of Digital ICS

Author:: Kapur, Rohit

ISBN:: 978-1-4020-7293-2

Book Format:: Hardback

List Price:: AUD $293.95

Publisher:: Springer London, Limited

Publication Date:: Jan 2002

5.

VLSI Test Principles and Architectures

Design for Testability

Author:: Wang, Laung-Terng
Wu, Cheng-Wen
Wen, Xiaoqing

ISBN:: 978-0-12-370597-6

Book Format:: Hardback

List Price:: AUD $100.00

Publisher:: Elsevier Science & Technology Books

Publication Date:: Jul 2006

6.

CTL for Test Information of Digital ICs

Author:: Kapur, Rohit

ISBN:: 978-1-4757-7800-7

Book Format:: Paperback

List Price:: AUD $293.95

Publisher:: Springer

Publication Date:: Oct 2013

7.

VLSI Test Principles and Architectures

Design for Testability

Author:: Wang, Laung-Terng
Wu, Cheng-Wen
Wen, Xiaoqing

ISBN:: 978-0-08-047479-3

Book Format:: Ebook

List Price:: USD $86.95USD $104.34

Publisher:: Elsevier

Publication Date:: Aug 2006

8.

VLSI Test Principles and Architectures

Design for Testability

Author:: Wang, Laung-Terng
Wu, Cheng-Wen
Wen, Xiaoqing

ISBN:: 978-0-12-370597-6

Book Format:: Hardback

List Price:: USD $89.95

Publisher:: Elsevier Science & Technology

Publication Date:: Aug 2006

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1.		CTL for Test Information of Digital ICS Author: Kapur, Rohit ISBN: 978-1-4020-7293-2 Book Format: Hardback List Price: USD $109.99 Publisher: Springer Publication Date: Oct 2002 Quantity Note

2.		CTL for Test Information of Digital ICs Author: Kapur, Rohit ISBN: 978-0-306-47826-0 Book Format: Ebook List Price: USD $179.00 Publisher: Springer London, Limited Publication Date: May 2007 Quantity Note

3.		CTL for Test Information of Digital ICs Author: Kapur, Rohit ISBN: 978-1-4757-7800-7 Book Format: Paperback List Price: USD $109.99 Publisher: Springer Publication Date: Apr 2013 Quantity Note

4.		CTL for Test Information of Digital ICS Author: Kapur, Rohit ISBN: 978-1-4020-7293-2 Book Format: Hardback List Price: AUD $293.95 Publisher: Springer London, Limited Publication Date: Jan 2002 Quantity Note

5.		VLSI Test Principles and Architectures Design for Testability Author: Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing ISBN: 978-0-12-370597-6 Book Format: Hardback List Price: AUD $100.00 Publisher: Elsevier Science & Technology Books Publication Date: Jul 2006 Quantity Note

6.		CTL for Test Information of Digital ICs Author: Kapur, Rohit ISBN: 978-1-4757-7800-7 Book Format: Paperback List Price: AUD $293.95 Publisher: Springer Publication Date: Oct 2013 Quantity Note

7.		VLSI Test Principles and Architectures Design for Testability Author: Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing ISBN: 978-0-08-047479-3 Book Format: Ebook List Price: USD $86.95USD $104.34 Publisher: Elsevier Publication Date: Aug 2006 Quantity Note

8.		VLSI Test Principles and Architectures Design for Testability Author: Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing ISBN: 978-0-12-370597-6 Book Format: Hardback List Price: USD $89.95 Publisher: Elsevier Science & Technology Publication Date: Aug 2006 Quantity Note